Title:
MICROCRYSTAL STRUCTURE ANALYSIS DEVICE, MICROCRYSTAL STRUCTURE ANALYSIS METHOD, AND X-RAY SHIELD DEVICE
Document Type and Number:
WIPO Patent Application WO/2013/118761
Kind Code:
A1
Abstract:
Provided are a microcrystal structure analysis device, a microcrystal structure analysis method, and an x-ray shield device, with which it is possible to obtain a favorable x-ray diffraction image even when illuminating a pseudo-single crystal sample with x-rays while rotating same. This microcrystal structure analysis device (1) comprises: a magnetic field emission unit (12); a sample drive unit (13) which rotates, with respect to the magnetic field emission unit (12), a sample container (2), which houses a sample in which microcrystals (3) are suspended, such that a magnetic field which fluctuates temporally is applied to the sample container (2) and the microcrystals (3) are three-dimensionally oriented; an x-ray source (21) which illuminates the sample container (2), which is being rotated by the sample drive unit (13), with an x-ray (a); an x-ray detector unit (23) which is capable of detecting x-rays (a) which pass through and are diffracted by the sample container (2); and a state switch device (G) which switches, according to the rotation location of a specific site (2a) which is a portion of the sample container (2) in the rotation direction, between a state in which the x-rays (a) cannot be detected by the x-ray detector unit (23) and a state in which the x-rays (a) can be detected by the x-ray detector unit (23).
Inventors:
KIMURA TSUNEHISA (JP)
KIMURA FUMIKO (JP)
TSUBOI CHIAKI (JP)
KIMURA FUMIKO (JP)
TSUBOI CHIAKI (JP)
Application Number:
PCT/JP2013/052704
Publication Date:
August 15, 2013
Filing Date:
February 06, 2013
Export Citation:
Assignee:
UNIV KYOTO (JP)
International Classes:
G01N23/20
Foreign References:
| JPH04301800A | 1992-10-26 | |||
| JP2006057055A | 2006-03-02 | |||
| JP2011033264A | 2011-02-17 |
Other References:
KENJI MATSUMOTO ET AL.: "Anisotropic Magnetic Susceptibility of Biaxial Crystal Determined by X-ray Diffraction Measurement", THE MAGNETO- SCIENCE SOCIETY OF JAPAN NENKAI PROGRAM YOSHISHU, 26 September 2011 (2011-09-26), pages 18 - 19, XP008174919
KEIJI FUJITA ET AL.: "Determination of Anisotropic Magnetic Susceptibility Ratio by X-ray Measurements", THE MAGNETO-SCIENCE SOCIETY OF JAPAN NENKAI PROGRAM YOSHISHU, 26 September 2011 (2011-09-26), pages 114 - 115, XP008174920
TSUNEHISA KIMURA: "kyoujiba wo mochiita bikesshou funmatsu no haikou seigyo -kaisetuhou, bunnkouhou eno ouyou- (Alignment of Powder Crystallites Under High Magnetic Field:Applications to Diffractometry and Spectroscopy", JOURNAL OF THE JAPANESE SOCIETY FOR NEUTRON SCIENCE, vol. 17, no. 1, 2007, pages 55 - 58
KEIJI FUJITA ET AL.: "Determination of Anisotropic Magnetic Susceptibility Ratio by X-ray Measurements", THE MAGNETO-SCIENCE SOCIETY OF JAPAN NENKAI PROGRAM YOSHISHU, 26 September 2011 (2011-09-26), pages 114 - 115, XP008174920
TSUNEHISA KIMURA: "kyoujiba wo mochiita bikesshou funmatsu no haikou seigyo -kaisetuhou, bunnkouhou eno ouyou- (Alignment of Powder Crystallites Under High Magnetic Field:Applications to Diffractometry and Spectroscopy", JOURNAL OF THE JAPANESE SOCIETY FOR NEUTRON SCIENCE, vol. 17, no. 1, 2007, pages 55 - 58
Attorney, Agent or Firm:
SunCrest Patent and Trademark Attorneys (JP)
Patent business corporation Sun Crest international patent firm (JP)
Patent business corporation Sun Crest international patent firm (JP)
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Claims: