Title:
MULTILAYER PREFORM INSPECTING METHOD AND MULTILAYER PREFORM INSPECTING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2013/099086
Kind Code:
A1
Abstract:
The present invention determines whether there is an intermediate layer in the whole or within a predetermined range of a multilayer preform, is capable of acquiring the results of the determination in a short time, and is also capable of determining whether an upper end portion and a lower end portion of the intermediate layer are positioned in an allowable range.
This multilayer preform inspecting method inspects whether there is an intermediate layer in a multilayer preform having a multilayer structure. In the method, the multilayer preform is irradiated with stripe-like light from the rear surface thereof, an image of the multilayer preform is picked up, and on the basis of a color shade detected from the image thus picked up, whether there is the intermediate layer is determined.
Inventors:
TAKADA JUNICHI (JP)
Application Number:
PCT/JP2012/007138
Publication Date:
July 04, 2013
Filing Date:
November 07, 2012
Export Citation:
Assignee:
TOYO SEIKAN GROUP HOLDINGS LTD (JP)
TAKADA JUNICHI (JP)
TAKADA JUNICHI (JP)
International Classes:
G01N21/958; G01N21/90
Foreign References:
| JP2011169735A | 2011-09-01 | |||
| JP2011012981A | 2011-01-20 | |||
| JP2007256076A | 2007-10-04 | |||
| JP2005049259A | 2005-02-24 | |||
| JP2005049258A | 2005-02-24 | |||
| JP2004117028A | 2004-04-15 | |||
| JP2003004650A | 2003-01-08 | |||
| JP2010204051A | 2010-09-16 | |||
| JP2001235425A | 2001-08-31 |
Attorney, Agent or Firm:
WATANABE, Kihei et al. (JP)
Kihei Watanabe (JP)
Kihei Watanabe (JP)
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Claims: