Title:
A NON-INTRUSIVE METHOD AND APPARATUS FOR CHARACTERIZING PARTICLES BASED ON SCATTERING OF ELLIPTICALLY POLARIZED RADIATION
Document Type and Number:
WIPO Patent Application WO2002025247
Kind Code:
A3
Abstract:
A non-intrusive method of characterizing particles through inverse analysis of experimental data based on measurements using elliptically polarized radiation is provided. A database of theoretical absorption and scattering data sets for particles is compiled. Optimum settings for an experimental test to gather an experimental absorption and scattering data set are determined and the experimental test is conducted. The experimental absorption and scattering data set is then compared to the theoretical absorption and scattering data sets of the database of theoretical absorpiton and scattering data sets in order to determine an absorption and scattering data set which differs the least from the experimental absorption and scattering data set in order to characterize the particles.
Inventors:
MENGUC M PINAR (US)
MANICKAVASAGAM SIVAKUMAR (US)
MANICKAVASAGAM SIVAKUMAR (US)
Application Number:
PCT/US2001/029240
Publication Date:
August 01, 2002
Filing Date:
September 19, 2001
Export Citation:
Assignee:
MENGUC M PINAR (US)
MANICKAVASAGAM SIVAKUMAR (US)
MANICKAVASAGAM SIVAKUMAR (US)
International Classes:
G01N15/02; G01N21/21; G01N21/47; G01Q60/00; (IPC1-7): G01N15/02
Domestic Patent References:
| WO1999060388A1 | 1999-11-25 |
Foreign References:
| EP0190628A2 | 1986-08-13 | |||
| US5576827A | 1996-11-19 | |||
| US3879615A | 1975-04-22 |
Other References:
M.P. MENGÜÇ, S. MANICKAVASAGAM: "Characterization of size and structure of agglomerates and inhomogeneous particles via polarized light", INTERNATIONAL JOURNAL OF ENGINEERING SCIENCE, vol. 36, 1998 - 1998, pages 1569 - 1593, XP002196322
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