Title:
NONDESTRUCTIVE INSPECTION SYSTEM AND SINGULARITY DETECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2016/162930
Kind Code:
A1
Abstract:
A nondestructive inspection system is provided with a drive device (105) for driving a conveyance device (106) for conveying an inspection subject (107), an excitation device (104) for applying heat to the surface of the inspection subject (107) conveyed by the conveyance device (106), a control device (102) for controlling the drive device (105) and excitation device (104), a photography device (103) for photographing a surface image of the inspection subject (107) that has had heat applied to the surface thereof by the excitation device (104), and a programmable display (100) having an image data processing unit (16) for dividing each of a plurality of surface images photographed at different times by the photography device (103) into a plurality of partial images and carrying out correction for aligning the positions of the inspection subject (107) in each of the plurality of surface images divided into a plurality of partial images and a display generation unit (20) for generating a moving image in which the plurality of surface images corrected by the image data processing unit (16) are switched chronologically or a three-dimensional image in which the images are layered chronologically.
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| WO/2003/076929 | METHOD FOR THE EVALUATION OF VELVET ANTLER |
| WO/2006/002150 | WAFER INSPECTION SYSTEM |
Inventors:
ORITO KOICHI (JP)
Application Number:
PCT/JP2015/060775
Publication Date:
October 13, 2016
Filing Date:
April 06, 2015
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01N25/72
Foreign References:
| JPH10311811A | 1998-11-24 | |||
| JP2008008705A | 2008-01-17 | |||
| JP2006337232A | 2006-12-14 | |||
| JP2012103176A | 2012-05-31 | |||
| JPS6168752U | 1986-05-10 |
Attorney, Agent or Firm:
TAKAMURA, JUN (JP)
Jun Takamura (JP)
Jun Takamura (JP)
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