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Patent Searching and Data


Title:
PACKAGE INSPECTING METHOD, INSPECTING DEVICE, AND PACKAGE
Document Type and Number:
WIPO Patent Application WO/2006/038704
Kind Code:
A1
Abstract:
Various seal defects including a bite defect are converted into variations of color tone of the captured image without encoding the defects to infallibly detect the seal defects. An imaging device (3) is disposed at a place corresponding to an inspection position on a movement line along which the seal portion of a package being transferred moves. A transmission illuminator (4) for illuminating the seal portion at the inspection position with alight of a characteristic wavelength is disposed at a place opposed to the imaging device (3), with the inspecting position interposed therebetween. An oblique illuminator (5) for illuminating the seal portion at the inspection position with a light of a wavelength characteristic different from that of the light of the transmission illuminator (4) is disposed on the same side as the image device (3) with respect to the movement line. Thus, the imaging device (3) can combinedly capture the transmission image formed by the transmission illuminator (4) and the reflection image formed by the oblique illuminator (5) as one image to acquire a multiband digital image and can detect seal defects on the basis of the image data.

Inventors:
SHIOKAWA SHUNICHI (JP)
SHIMAMURA ETSUO (JP)
KOBAYASHI MASAAKI (JP)
SOGA RYOICHI (JP)
HARA KOJI (JP)
Application Number:
PCT/JP2005/018719
Publication Date:
April 13, 2006
Filing Date:
October 04, 2005
Export Citation:
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Assignee:
TOPPAN PRINTING CO LTD (JP)
SHIOKAWA SHUNICHI (JP)
SHIMAMURA ETSUO (JP)
KOBAYASHI MASAAKI (JP)
SOGA RYOICHI (JP)
HARA KOJI (JP)
International Classes:
G01N21/88; B65B57/02
Foreign References:
JPS6363A1988-01-05
JP2002116152A2002-04-19
JP2000009591A2000-01-14
JPH06208017A1994-07-26
Attorney, Agent or Firm:
Akimoto, Teruo (Minato-ku Tokyo, 62, JP)
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