Title:
PANTOGRAPH MEASUREMENT METHOD, AND PANTOGRAPH MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2013/129153
Kind Code:
A1
Abstract:
A pantograph measurement method by means of image processing comprising a process (S1) for acquiring a video image of a marker (50) disposed on a pantograph (40) and for generating a space-time image from the acquired video, and a process (S2) for searching for the marker (50) by comparing the search patterns in accordance with the height of the space-time image, wherein: the marker (50) has a stripe pattern in which a first region (51) that cannot easily reflect light and a second region (52) that can easily reflect light are alternately disposed, at least two second regions (52) are disposed, and the stripe width of the second regions are different from one another; and the search pattern corresponds to the stripe pattern of the marker.
Inventors:
WATABE YUSUKE (JP)
NIWAKAWA MAKOTO (JP)
NIWAKAWA MAKOTO (JP)
Application Number:
PCT/JP2013/053826
Publication Date:
September 06, 2013
Filing Date:
February 18, 2013
Export Citation:
Assignee:
MEIDENSHA ELECTRIC MFG CO LTD (JP)
International Classes:
G01B11/00; B60L5/26; B60M1/28
Foreign References:
JP2009244023A | 2009-10-22 | |||
JP2010190886A | 2010-09-02 | |||
JP2009198370A | 2009-09-03 | |||
EP2404777A1 | 2012-01-11 | |||
JP2008004312A | 2008-01-10 | |||
JP2008104312A | 2008-05-01 |
Other References:
"Modern Technology of Electric Railroad Equipment Maintenance", INSTITUTE OF ELECTRIC ENGINEERS OF JAPAN
Attorney, Agent or Firm:
MITSUISHI, Toshiro et al. (JP)
Toshiro Mitsuishi (JP)
Toshiro Mitsuishi (JP)
Download PDF:
Claims:
Previous Patent: LIQUID CRYSTAL DISPLAY DEVICE
Next Patent: MANUFACTURING METHOD OF COMPONENT-INTERNAL SUBSTRATE
Next Patent: MANUFACTURING METHOD OF COMPONENT-INTERNAL SUBSTRATE