Title:
PARAMETER ADJUSTMENT DEVICE, MACHINE TOOL SYSTEM, AND PARAMETER ADJUSTMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2022/259418
Kind Code:
A1
Abstract:
A parameter adjustment device (1) comprises: a sampling unit (100) that acquires, as sampling information, a numerical control command output by a numerical control device or a feedback signal that is a measurement value of a sensor installed in a machine tool that executes processing on the basis of the numerical control command, and creates position information that is information for associating the sampling information with a processing program; an interface unit (200) that acquires a specified range that is a certain range of the sampling information and specified information for specifying the details of change in sampling information within the specified range; a position specification unit (300) that specifies processing program relevant positions that are each relevant position of the specified range in the processing program on the basis of the position information and the specified range; an analysis unit (400) that uses each detail of the specified information to derive an adjustment parameter that is a parameter satisfying the specified information; and a parameter reflection unit (500) that reflects the adjustment parameter in each of the processing program relevant positions.
Inventors:
NISHINO SHINYA (JP)
Application Number:
PCT/JP2021/021911
Publication Date:
December 15, 2022
Filing Date:
June 09, 2021
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05B19/18
Foreign References:
| JPH0895643A | 1996-04-12 | |||
| JPH06278173A | 1994-10-04 | |||
| JPH04307605A | 1992-10-29 | |||
| JP2016130908A | 2016-07-21 |
Attorney, Agent or Firm:
TAKAMURA, Jun (JP)
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