Title:
PARTICLE ANALYZING DEVICE, PARTICLE ANALYSIS METHOD, AND PARTICLE ANALYSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/189169
Kind Code:
A1
Abstract:
In particle analysis employing a PTA method, in order to enable each particle to be analyzed by type while limiting an increase in device size and cost, even if excitation wavelengths of fluorescent markers or particles having autofluorescent properties overlap one another, this particle analyzing device is configured to comprise: a light emitting unit (2) for emitting exciting light onto a sample that emits fluorescence in a plurality of colors; one or a plurality of filters (5) that transmit the fluorescence in the plurality of colors while cutting the exciting light; an imaging unit (3) having a color discrimination capability, for imaging the fluorescence transmitted through the filters (5); and an analyzing unit (43) for analyzing a physical property of the particles contained in the sample by obtaining a diffusion speed, by Brownian motion, of the particles from fluorescence image data obtained by means of the imaging unit (3).
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Inventors:
TATEWAKI YASUHIRO (JP)
Application Number:
PCT/JP2023/007791
Publication Date:
October 05, 2023
Filing Date:
March 02, 2023
Export Citation:
Assignee:
HORIBA LTD (JP)
International Classes:
G01N15/02; G01N21/64
Domestic Patent References:
| WO2019230636A1 | 2019-12-05 | |||
| WO2022185592A1 | 2022-09-09 |
Foreign References:
| JP2020204604A | 2020-12-24 | |||
| JP2014521967A | 2014-08-28 | |||
| JP2012088304A | 2012-05-10 | |||
| JP2005245317A | 2005-09-15 | |||
| US20080085550A1 | 2008-04-10 |
Attorney, Agent or Firm:
NISHIMURA, Ryuhei et al. (JP)
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