Title:
PARTICLE SIZE DISTRIBUTION MEASURING DEVICE AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/230624
Kind Code:
A1
Abstract:
In order to accurately obtain a particle size distribution of a particle group to be measured, even when the influence of a particle group not being subjected to measurement is large, a particle size distribution measuring device 100 irradiates, with light, a particle group to be measured contained in a cell 11, and calculates a particle size distribution of the particle group on the basis of an optical intensity signal indicative of the optical intensity of the resultant diffracted/scattered light, and is configured to be provided with: an actual spectrum acquisition unit 21 that acquires an actual spectrum which is an optical intensity spectrum obtained from an optical intensity signal; a non-target spectrum calculation unit 22 that receives non-target particle size distribution data indicating a particle size distribution of a non-target particle group which is contained in the cell 11 but is not an object X to be measured, and that calculates, on the basis of the non-target particle size distribution data, a non-target spectrum which is an optical intensity spectrum expected to be obtained upon irradiation of the non-target particle group with light; a non-target spectrum removing unit 23 that calculates a target spectrum which is an optical intensity spectrum obtained by subtracting the influence amount of the non-target spectrum from the actual spectrum; and a target particle size distribution calculation unit 24 that calculates a particle size distribution of a particle group which is the object X to be measured, on the basis of the target spectrum target spectrum.
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Inventors:
MORI TETSUYA (JP)
AKIYAMA HISASHI (JP)
NAGURA MAKOTO (JP)
AKIYAMA HISASHI (JP)
NAGURA MAKOTO (JP)
Application Number:
PCT/JP2019/020824
Publication Date:
December 05, 2019
Filing Date:
May 27, 2019
Export Citation:
Assignee:
HORIBA LTD (JP)
International Classes:
G01N15/02
Domestic Patent References:
WO2018092462A1 | 2018-05-24 |
Foreign References:
JP2018004450A | 2018-01-11 | |||
JP2016048185A | 2016-04-07 | |||
JP2017167081A | 2017-09-21 | |||
JP2008164539A | 2008-07-17 | |||
JP2018004450A | 2018-01-11 |
Other References:
See also references of EP 3786611A4
Attorney, Agent or Firm:
NISHIMURA, Ryuhei (JP)
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