Title:
PLANT ABNORMALITY DIAGNOSIS DEVICE AND PLANT ABNORMALITY DIAGNOSIS SYSTEM
Document Type and Number:
WIPO Patent Application WO/2018/051568
Kind Code:
A1
Abstract:
Provided are a plant abnormality diagnosis device and a plant abnormality diagnosis system capable of determining an abnormality at an early stage in a plant as a whole during plant abnormality diagnosis using adaptive resonance theory (ART). A plant abnormality diagnosis device 2 is provided with an abnormality degree calculation unit 103 which, with respect to a plurality of pieces of measurement data from various sensors installed in the plant 5 to be diagnosed, determines an abnormality degree A of a plant 5 to be diagnosed, as a whole, on the basis of a difference in spatial distance between data belonging to a category determined by ART using data at a normal time and the plurality of pieces of measurement data.
Inventors:
HAYASHI YOSHIHARU (JP)
SEKIAI TAKAAKI (JP)
SEKIAI TAKAAKI (JP)
Application Number:
PCT/JP2017/015419
Publication Date:
March 22, 2018
Filing Date:
April 17, 2017
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G05B23/02
Domestic Patent References:
| WO2015182317A1 | 2015-12-03 | |||
| WO2011089649A1 | 2011-07-28 |
Foreign References:
| JP2016081482A | 2016-05-16 | |||
| JP2016038688A | 2016-03-22 | |||
| JP2015021901A | 2015-02-02 | |||
| JP2016081482A | 2016-05-16 |
Other References:
See also references of EP 3514642A4
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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