Title:
POTENTIAL DETECTION SUBSTRATE AND POTENTIAL MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/070113
Kind Code:
A1
Abstract:
A potential detection substrate according to an embodiment of the present disclosure is provided to detect the potential of a liquid sample. A first potential detection substrate is provided with, on a substrate, one or a plurality of electrodes and a plurality of wires respectively connected to the electrodes. The electrodes each have an uneven surface with one or a plurality of recessed sections formed by patterning. The widths of the one or the plurality of recessed sections are greater than two times the thickness of an electric double layer formed in contact with the uneven surface.
Inventors:
HIRATA AKIKO (JP)
Application Number:
PCT/JP2017/030254
Publication Date:
April 19, 2018
Filing Date:
August 24, 2017
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
G01N27/416; G01N27/30
Domestic Patent References:
| WO2015177862A1 | 2015-11-26 | |||
| WO2012144631A1 | 2012-10-26 | |||
| WO2009031375A1 | 2009-03-12 |
Foreign References:
| JP2011507556A | 2011-03-10 | |||
| JP2004166692A | 2004-06-17 | |||
| JP2001281201A | 2001-10-10 |
Attorney, Agent or Firm:
TSUBASA PATENT PROFESSIONAL CORPORATION (JP)
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