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Patent Searching and Data


Title:
PRECISE TIME MEASUREMENT APPARATUS AND METHOD
Document Type and Number:
WIPO Patent Application WO2006004829
Kind Code:
A3
Abstract:
A time measurement system that uses two signals generated by direct digital synthesis. The generated signals have the same frequency but different phase. One signal is used to identify the start of the measurement interval and the other signal is used to identify a measurement window in which a signal indicating the end of the measured interval might be detected. The time measurement system is used as part of a time domain reflectometry (TDR) system. An incident pulse is synchronized to the first signal and launched down on a line. In the measurement window, the signal on the line is compared to a threshold value to determine whether the pulse has been reflected and traveled back to the source. By iteratively repeating the measurement with a different measurement window, the time of arrivall of the reflected pulse can be determined. This time domain reflectometry approach is incorporated into automatic test equipment for testing semiconductor devices and is used to calibrate the test equipment.

Inventors:
GAGE ROBERT BRUCE (US)
SALMI JACOB ALVIN (US)
Application Number:
PCT/US2005/023088
Publication Date:
May 04, 2006
Filing Date:
June 30, 2005
Export Citation:
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Assignee:
TERADYNE INC (US)
GAGE ROBERT BRUCE (US)
SALMI JACOB ALVIN (US)
International Classes:
G01R31/3193; G01R31/30; G01R31/317
Foreign References:
US20030208717A12003-11-06
US6622107B12003-09-16
US6609077B12003-08-19
EP1550934A12005-07-06
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