PROBE INSPECTION METHOD AND CURED RESIN COMPOSITION

WIPO Patent Application WO/2012/111154

A1

Provided are: a probe inspection method that confirms the state of a probe for inspecting the electrical characteristics of a subject of inspection; and a cured resin composition used in the probe inspection method. The probe inspection method contains a step wherein a cured body of a specific cured resin composition is brought into contact with the probe for inspecting the electrical characteristics of a subject of inspection, the needle mark of the probe is transferred to the cured body, the state of the probe is confirmed on the basis of the transferred needle mark, and after transferring the needle mark of the probe, the cured body is heated to at least the glass transition temperature of the cured body, eliminating the needle mark of the probe. By means of the step, the cured body is repeatedly made available for inspecting. The cured resin composition contains a specific monofunctional (meth)acrylate, a photoinitiator, and an antioxidant. The glass transition temperature of the cured body of the cured resin composition is 40-100°C inclusive.

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NAKAJIMA GOSUKE (JP)
WATANABE JUN (JP)

PCT/JP2011/053552

August 23, 2012

February 18, 2011

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DENKI KAGAKU KOGYO KK (JP)
NAKAJIMA GOSUKE (JP)
WATANABE JUN (JP)

G01R31/28; C08F2/50; C08L33/04; G01R1/06; H01L21/66

WO2009107558A1	2009-09-03
WO2006129678A1	2006-12-07

JP2007077321A	2007-03-29
JP2006161038A	2006-06-22
JP2008101151A	2008-05-01

AXIS Patent International (JP)
Axis international patent business corporation (JP)

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