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Patent Searching and Data


Title:
PROBE FOR MEASURING CONNECTOR AND METHOD OF MEASURING CONNECTOR
Document Type and Number:
WIPO Patent Application WO/2021/060189
Kind Code:
A1
Abstract:
This probe (101) for measuring a connector is connected to a connector to be measured. A plurality of probe parts (10) each have an outer conductor (12) and central conductors (11A-11H) in contact with a signal terminal. A plunger (2) comprises: insertion holes (H) into which the probe parts (10) are to be respectively inserted; and a ground conductor part (20) in contact with the ground terminal of the connector to be measured. The central conductors (11A-11H) are held in a state of being insulated from the outer conductor (12) such that the central conductors can protrude from a main surface (MS) of the plunger (2). The ground conductor part (20) has a protrusion part protruding in a protrusion direction of the central conductors (11A-11H) and a direction along the main surface (MS) between central conductors (11A-11B) of probe parts (10) adjacent on one side thereof and central conductors (11A-11H) of probe parts (10) adjacent on the other side thereof, among the plurality of probe parts (10).

Inventors:
ARAKI KIYOTO (JP)
Application Number:
PCT/JP2020/035482
Publication Date:
April 01, 2021
Filing Date:
September 18, 2020
Export Citation:
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Assignee:
MURATA MANUFACTURING CO (JP)
International Classes:
H01R43/00; G01R1/06; G01R1/073; H01R13/24; H01R24/38
Foreign References:
US20090224785A12009-09-10
US20100255690A12010-10-07
JP2005149854A2005-06-09
JP2003123910A2003-04-25
JP2020020663A2020-02-06
Attorney, Agent or Firm:
KAEDE PATENT ATTORNEYS' OFFICE (JP)
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