Title:
PROBE PIN, TESTING JIG, AND TESTING UNIT
Document Type and Number:
WIPO Patent Application WO/2020/250638
Kind Code:
A1
Abstract:
This probe pin comprises: a plate-shaped body section; a first contact point section provided on one end of the body section in a first direction; and a pair of second contact point sections that are provided on one end of the body section in the first direction, that are disposed spaced apart from the first contact point section on both sides of the first contact point section in the second direction, and that extend to a position that is farther from the body section than the first contact point section. The second contact point sections respectively have guide surfaces that are disposed so as to oppose each other in the second direction, and that guide a contact object approaching the first contact point section in the first direction towards the first contact point section.
Inventors:
SASANO NAOYA (JP)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
Application Number:
PCT/JP2020/020167
Publication Date:
December 17, 2020
Filing Date:
May 21, 2020
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067; G01R31/26
Foreign References:
| JP2017223628A | 2017-12-21 | |||
| JP2002214286A | 2002-07-31 | |||
| JP2016038207A | 2016-03-22 | |||
| JP2018159707A | 2018-10-11 | |||
| JP2002373748A | 2002-12-26 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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