PROGRAM-CONTROLLED MICROSCOPE AND METHOD FOR EXTERNALLY CONTROLLING MICROSCOPES

Title:

PROGRAM-CONTROLLED MICROSCOPE AND METHOD FOR EXTERNALLY CONTROLLING MICROSCOPES

Document Type and Number:

WIPO Patent Application WO2005124424

Kind Code:

A8

Abstract:

The invention relates to a program-controlled microscope (1) and to a method for externally controlling microscopes. The aim of the invention is to guarantee the availability of externally generated data independently of the data-generating external control unit (3). The microscope comprises an interface for filing data in and/or reading data from a memory in the microscope, whereby said data has been externally generated by the control unit and is not available in the control program inside the microscope.

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Inventors:

LEIDENBACH STEFFEN (DE)

Application Number:

PCT/DE2005/001087

Publication Date:

April 27, 2006

Filing Date:

June 15, 2005

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Assignee:

ZEISS CARL JENA GMBH (DE)
LEIDENBACH STEFFEN (DE)

International Classes:

G02B21/36; (IPC1-7): G02B21/36

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