Title:
RADIATION MEASUREMENT DEVICE AND RADIATION MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2021/166295
Kind Code:
A1
Abstract:
Provided are a radiation measurement device and a radiation measurement method that make it possible to acquire the internal state of a to-be-inspected subject at high resolution with respect to an internal direction, and to implement high-level analysis and monitoring. A radiation measurement device (100) comprising: a single-color photon source (101) that controls the emission direction of single-color photons or quasi-single-color photons; a radiation detector (102) that detects Compton scattering photons that have scattered from a to-be-inspected subject (106), the relative coordinates of the radiation detector (102) relative to the single-color photon source (101) being known; an energy measurement device (103) that measures the energy and intensity of the detected Compton scattering photons; a depth computation device (104) that, on the basis of the relative coordinates and the energy and intensity of the Compton scattering photons, computes the intensity distribution for the Compton scattering photons in the depth direction of the to-be-inspected subject (106); and a display device (105) that displays the result of computation.
Inventors:
UENO KATSUNORI (JP)
NAGUMO YASUSHI (JP)
NAKASHIMA YUTO (JP)
NAGUMO YASUSHI (JP)
NAKASHIMA YUTO (JP)
Application Number:
PCT/JP2020/034292
Publication Date:
August 26, 2021
Filing Date:
September 10, 2020
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G01N23/20066; G01T1/20; G01T1/24
Foreign References:
| JP2018013439A | 2018-01-25 | |||
| JP2017096724A | 2017-06-01 | |||
| JP2008002940A | 2008-01-10 | |||
| JP2012032220A | 2012-02-16 | |||
| JP2009135018A | 2009-06-18 | |||
| JP2009503506A | 2009-01-29 |
Other References:
SUZUKI KOSUKE , SAKURAI HIROSHI: "In- operando Three-Dimensional Measurement of Quantum State in the Practical Devices Using High-energy X-ray Compton Scattering Spectroscopy", VACUUM AND SURFACE SCIENCE, vol. 61, no. 12, 10 December 2018 (2018-12-10), pages 790 - 796, XP055849883, ISSN: 2433-5835, DOI: 10.1380/vss.61.790
TERASAKA AYUMU: "Operand Measurement of Electrode Reaction in Lithium-Ion Secondary Batteries that have Degraded due to Compton Scattering", DOCTORAL THESIS, 14 March 2019 (2019-03-14), JP, pages 1 - 44, XP009530747
YAZAWA, Y.: "Compton Scattering and the Klein-Nishina Formula", BACHELOR THESIS, 15 February 2016 (2016-02-15), JP, pages 1 - 19, XP009530751
SABHARWAL, A.D. ; SINGH, B. ; SANDHU, B.S.: "Investigations of multiple back scattering and albedos of 1.12 MeV gamma photons in elements and alloys", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B: BEAM INTERACTIONS WITH MATERIALS AND ATOMS, vol. 267, no. 1, 1 January 2009 (2009-01-01), NL, pages 151 - 156, XP025880855, ISSN: 0168-583X, DOI: 10.1016/j.nimb. 2008.10.07 2
TOYOKAWA HIROYUKI: "Development of Back Scattering X-Ray Inspection Device Intended for Infrastructure Assessment", 25 September 2013 (2013-09-25), JP, pages 1 - 15, XP009532039, Retrieved from the Internet
TERASAKA AYUMU: "Operand Measurement of Electrode Reaction in Lithium-Ion Secondary Batteries that have Degraded due to Compton Scattering", DOCTORAL THESIS, 14 March 2019 (2019-03-14), JP, pages 1 - 44, XP009530747
YAZAWA, Y.: "Compton Scattering and the Klein-Nishina Formula", BACHELOR THESIS, 15 February 2016 (2016-02-15), JP, pages 1 - 19, XP009530751
SABHARWAL, A.D. ; SINGH, B. ; SANDHU, B.S.: "Investigations of multiple back scattering and albedos of 1.12 MeV gamma photons in elements and alloys", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B: BEAM INTERACTIONS WITH MATERIALS AND ATOMS, vol. 267, no. 1, 1 January 2009 (2009-01-01), NL, pages 151 - 156, XP025880855, ISSN: 0168-583X, DOI: 10.1016/j.nimb. 2008.10.07 2
TOYOKAWA HIROYUKI: "Development of Back Scattering X-Ray Inspection Device Intended for Infrastructure Assessment", 25 September 2013 (2013-09-25), JP, pages 1 - 15, XP009532039, Retrieved from the Internet
Attorney, Agent or Firm:
ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)
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