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Patent Searching and Data


Title:
RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
Document Type and Number:
WIPO Patent Application WO/2022/264941
Kind Code:
A1
Abstract:
A resist composition which contains: a resin component (A1) having a constituent unit (a01) that contains an acid-cleavable group represented by formula (a01-r); and an acid generator component (B) that contains a compound (B0) represented by formula (b0). In the formulae, Ra01 , and Ra02 represent saturated aliphatic hydrocarbon groups which may combine with each other to form an alicyclic group; Ra03 to Ra05 represent aliphatic hydrocarbon groups or the like, two or more of which may combine with each other to form an alicyclic group; X0 represents an iodine atom or the like; Rm represents a hydroxy group or the like; nb1 represents an integer of 1 to 5; nb2 represents an integer of 0 to 4; 1 ≤ nb1 + nb2 ≤ 5; Yb0 represents a divalent linking group or the like; Vb0 represents an alkylene group or the like; R0 represents a fluorinated alkyl group having 1 to 5 carbon atoms, or the like; and Mm+ represents an m-valent organic cation.

Inventors:
ISHII SHUICHI (JP)
KATO HIROKI (JP)
NGUYEN KHANHTIN (JP)
IKEDA TAKUYA (JP)
ONISHI KOSHI (JP)
ODASHIMA RIN (JP)
FUJINAMI TETSUO (JP)
TODOROKI SEIJI (JP)
KAWATANI RYO (JP)
Application Number:
PCT/JP2022/023477
Publication Date:
December 22, 2022
Filing Date:
June 10, 2022
Export Citation:
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Assignee:
TOKYO OHKA KOGYO CO LTD (JP)
International Classes:
C07D327/06; C07D333/76; C08F220/12; C08F220/28; G03F7/004; G03F7/039; G03F7/20
Domestic Patent References:
WO2021070590A12021-04-15
WO2021039244A12021-03-04
Foreign References:
JP2021067934A2021-04-30
JP2021071720A2021-05-06
Attorney, Agent or Firm:
TAZAKI Akira et al. (JP)
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