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Patent Searching and Data


Title:
RESISTANCE MEASURING APPARATUS AND MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2010/050673
Kind Code:
A2
Abstract:
The present invention relates to a resistance measuring apparatus and to a measuring method, said apparatus comprising a power supply unit for supplying constant voltage to two fixed voltage sources, a resistance unit connected in parallel to the power supply unit and which includes two reference resistances connected in serial with a potentiometer disposed therebetween, a voltmeter for measuring the voltage between the connection node of said two fixed voltage sources and the variable terminal node of the potentiometer, and an electrical connection means for connecting a resistance to be measured in parallel to either of said two reference resistances. The resistance measuring apparatus and the measuring method according to the present invention are advantageous in that an input of a detector is directly connected to a well-defined common ground to reduce influences from noise and thus enable the measurement of high insulation resistance, and just two reference resistances are selected even without causing a deterioration of the measurement sensitivity during a selection of a measurement range to simplify a circuit configuration and improve the reliability of the measurement result.

Inventors:
KIM KYU TAE (KR)
YU KWANG MIN (KR)
Application Number:
PCT/KR2009/005077
Publication Date:
May 06, 2010
Filing Date:
September 08, 2009
Export Citation:
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Assignee:
KOREA RES INST OF STANDARDS (KR)
KIM KYU TAE (KR)
YU KWANG MIN (KR)
International Classes:
G01R27/08
Foreign References:
JPH05264616A1993-10-12
JP2005207926A2005-08-04
JP2007240320A2007-09-20
Attorney, Agent or Firm:
DANA PATENT LAW FIRM (KR)
특허법인다나 (KR)
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