Title:
RESONANCE FREQUENCY DETERMINING METHOD, RESONANCE FREQUENCY SELECTING METHOD, AND RESONANCE FREQUENCY DETERMINING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2005/104610
Kind Code:
A1
Abstract:
The resonance frequency of a magnified-sound space is determined based on a basic amplitude/frequency characteristic obtained by sound magnifying, from a speaker (13) located in the magnified-sound space (40), a predetermined measurement signal and then receiving the sound by use of a microphone (14) located in the magnified-sound space (40); also based on a first amplitude/frequency characteristic obtained by sound magnifying, from the speaker (13), the measurement signal and a first delayed signal, which is obtained by delaying an output signal from the microphone (14) by a first delay time of zero or more, and then receiving the sound by use of the microphone (14); further based on a second amplitude/frequency characteristic obtained by sound magnifying, from the speaker (13), the measurement signal and a second delayed signal, which is obtained by delaying an output signal from the microphone (14) by a second delay time of zero or more, and then receiving the sound by use of the microphone (14). The second delay time is different in value from the first delay time.
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Inventors:
HIGASHIHARA DAISUKE (JP)
Application Number:
PCT/JP2005/007868
Publication Date:
November 03, 2005
Filing Date:
April 26, 2005
Export Citation:
Assignee:
TOA CORP (JP)
HIGASHIHARA DAISUKE (JP)
HIGASHIHARA DAISUKE (JP)
International Classes:
H04R27/00; H04R3/04; H04R29/00; (IPC1-7): H04R3/04
Foreign References:
| JPH06202671A | 1994-07-22 | |||
| JPS60232797A | 1985-11-19 | |||
| JPH08294194A | 1996-11-05 | |||
| JPH07154467A | 1995-06-16 | |||
| JP2000115883A | 2000-04-21 | |||
| JPH06265401A | 1994-09-22 |
Other References:
See also references of EP 1748674A4
None
None
Attorney, Agent or Firm:
Sumida, Yoshihiro (3rd Fl. Bo-eki Bldg., 123-1, Higashimachi, Chuo-k, Kobe-shi Hyogo 31, JP)
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