Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
RISC-V EXTENSION INSTRUCTION-BASED SOURCE CODE COVERAGE RATE TEST METHOD AND SYSTEM
Document Type and Number:
WIPO Patent Application WO/2021/077735
Kind Code:
A1
Abstract:
A RISC-V extension instruction-based source code coverage rate test method and system. The method comprises: carrying out syntax tree analysis on a source code, obtaining an instrumentation point, and defining the instrumentation point as a set position; slicing the source code according to a syntax structure of the source code, and performing instrumentation at the set position, an instrumentation statement of the instrumentation being an RISC-V-based extension instruction; executing the source code, and performing data acquisition on output of the extension instruction to obtain instrumentation output information; and according to the instrumentation statement and the instrumentation output information, performing analysis to obtain a source code coverage rate test result. By extending the RISC-V instruction, the solutions achieves external high-speed data sending inside a CPU, and compared with an asynchronous bus, the number of pins is greatly reduced; a board under test does not require fly wire, so that the workload is greatly reduced.

Inventors:
QIN WEI (CN)
YANG BOBO (CN)
KONG XIANGLEI (CN)
ZHANG ZHIQIANG (CN)
XU SHUQING (CN)
Application Number:
PCT/CN2020/092358
Publication Date:
April 29, 2021
Filing Date:
May 26, 2020
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
VISION MICROSYSTEMS SHANGHAI CO LTD (CN)
International Classes:
G06F11/36
Foreign References:
CN101833500A2010-09-15
CN110750957A2020-02-04
US20030145309A12003-07-31
CN110765017A2020-02-07
Other References:
LU, SHUAIBING ET AL.: "Dynamic Binary Translation and Instrumentation Based Function Call Tracing", JOURNAL OF COMPUTER RESEARCH AND DEVELOPMENT, vol. 56, no. 2, 15 February 2019 (2019-02-15), pages 421 - 430, XP055804639
Attorney, Agent or Firm:
DUAN & DUAN LAW FIRM (CN)
Download PDF: