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Patent Searching and Data


Title:
SAMPLE ANALYZER
Document Type and Number:
WIPO Patent Application WO/2023/021904
Kind Code:
A1
Abstract:
Provided is a sample analyzer that increases the collection rate of magnetic particles. The sample analyzer is provided with: a flow path for introducing a sample liquid containing magnetic particles bonded to a specific substance into a capture region; a supply means for supplying the sample liquid to the flow path; a capture means which has a magnetic field structure for generating a magnetic field and which makes the magnetic particles be adsorbed by the magnetic field onto the capture region; a measurement means for measuring the specific substance adsorbed onto the capture region; and a discharge means for discharging the magnetic particles from the flow path after the measurement has been performed by the measurement means. The magnetic field structure is disposed outside the flow path and is provided with a plurality of magnets having different magnetization directions, and the plurality of magnets are disposed such that the magnetic flux density on the flow path side is greater than the magnetic flux density on the opposite side to the flow path.

Inventors:
ITO HIROSHI (JP)
FUKUMURA MAMI (JP)
SUGIMURA YOSHIAKI (JP)
OGUCHI SO (JP)
Application Number:
PCT/JP2022/027987
Publication Date:
February 23, 2023
Filing Date:
July 19, 2022
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/08
Domestic Patent References:
WO2020061696A12020-04-02
Foreign References:
JP2013238420A2013-11-28
JP2004535292A2004-11-25
JP2019152655A2019-09-12
JP2021135063A2021-09-13
Other References:
MOTOKAWA: "High Magnetic Field and Material Science", MATERIAL JAPAN, vol. 37, 1998, pages 926 - 930
Attorney, Agent or Firm:
HIRAKI & ASSOCIATES (JP)
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