Title:
SAMPLE SUPPORT
Document Type and Number:
WIPO Patent Application WO/2022/038843
Kind Code:
A1
Abstract:
This sample support is used for ionizing a component of a sample, the sample support comprising: a substrate having a first surface, and a plurality of holes opened in the first surface; and a conductive layer provided so as not to block the holes on the first surface, wherein the conductive layer is composed of a plurality of nanoparticles and has a thickness of at least 30 nm.
Inventors:
TASHIRO AKIRA (JP)
OHMURA TAKAYUKI (JP)
KOTANI MASAHIRO (JP)
IKEDA TAKAMASA (JP)
OHMURA TAKAYUKI (JP)
KOTANI MASAHIRO (JP)
IKEDA TAKAMASA (JP)
Application Number:
PCT/JP2021/017722
Publication Date:
February 24, 2022
Filing Date:
May 10, 2021
Export Citation:
Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
B82Y30/00; G01N27/62; H01J49/04
Domestic Patent References:
| WO2013122225A1 | 2013-08-22 |
Foreign References:
| JP2010071727A | 2010-04-02 | |||
| JP6093492B1 | 2017-03-08 | |||
| JP2008070187A | 2008-03-27 | |||
| US20120104243A1 | 2012-05-03 | |||
| JP6093492B1 | 2017-03-08 |
Other References:
TETSU YONEZAWA, HIDEYA KAWASAKI, AKIRA TARUI, TAKEHIRO WATANABE, RYUICHI ARAKAWA, TOSHIHIRO SHIMADA, FUMITAKA MAFUNÉ: "Detailed Investigation on the Possibility of Nanoparticles of Various Metal Elements for Surface-Assisted Laser Desorption/Ionization Mass Spectrometry", ANALYTICAL SCIENCES, vol. 25, 1 March 2009 (2009-03-01), pages 339 - 346, XP055909184
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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