Title:
SCAN TUNNEL SPECTRAL METHOD AND SCAN TUNNEL MICROSCOPE
Document Type and Number:
WIPO Patent Application WO/2007/013371
Kind Code:
A1
Abstract:
A scan tunnel microscope includes: a current-voltage conversion circuit (12) for converting tunnel current into voltage in scan tunnel spectral measurement mode; threshold value setting means (14, 16) for setting a threshold value in a range where no tunnel current which would destroy a surface of a sample (4) or a probe (2) flows; and a comparison circuit (18) for outputting a signal for controlling a bias voltage sweep circuit of a bias voltage application/sweep circuit (8) so that the output voltage of the current-voltage conversion circuit (12) will not exceed the threshold value.
Inventors:
KAWAI TOMOJI (JP)
TANAKA HIROYUKI (JP)
TANAKA HIROYUKI (JP)
Application Number:
PCT/JP2006/314495
Publication Date:
February 01, 2007
Filing Date:
July 21, 2006
Export Citation:
Assignee:
SHIMADZU CORP (JP)
UNIV OSAKA (JP)
KAWAI TOMOJI (JP)
TANAKA HIROYUKI (JP)
UNIV OSAKA (JP)
KAWAI TOMOJI (JP)
TANAKA HIROYUKI (JP)
International Classes:
G01Q60/10; G01Q60/12
Foreign References:
| JPH05322511A | 1993-12-07 | |||
| JP2002365194A | 2002-12-18 | |||
| JP2000074930A | 2000-03-14 |
Other References:
NOJIMA Y. ET AL.: "High-Resolution Scanning Tunneling Microscopy and Spectroscopy Studies of Deoxyribonucleic Acid and Fluorescein Isothiocyanate", JPN. J. APPL. PHYS., vol. 43, no. 8A, 2004, pages 5526 - 5527, XP003007703
Attorney, Agent or Firm:
NOGUCHI, Shigeo (Rapport Nanba Bldg. 9F 8-1, Motomachi 2-chome, Naniwa-ku, Osaka-sh, Osaka 16, JP)
Download PDF: