Title:
SCINTILLATOR PANEL, RADIATION DETECTOR USING SAME, LINE CAMERA AND RADIATION INSPECTION DEVICE, AND INLINE INSPECTION METHOD AND INSPECTION METHOD USING SAME
Document Type and Number:
WIPO Patent Application WO/2022/024860
Kind Code:
A1
Abstract:
Provided is a high-brightness scintillator panel for which brightness deterioration resulting from being irradiated with radiation is suppressed. This scintillator panel comprises a substrate and a scintillator layer including a fluorescent substance. The scintillator layer comprises a binder resin having a π-conjugated system structure configured from 7 or more atoms and a glass transition point of 30-430 °C. The film thickness of the scintillator layer is 50-800 μm.
More Like This:
WO/2003/007019 | RADIATION THREE−DIMENSIONAL POSITION DETECTOR |
JP2008503086 | X-ray image detector |
Inventors:
MIYAO SHO (JP)
MURAI TAKAHIRO (JP)
KOBAYASHI YASUHIRO (JP)
FUJIOKA NOBUYASU (JP)
MURAI TAKAHIRO (JP)
KOBAYASHI YASUHIRO (JP)
FUJIOKA NOBUYASU (JP)
Application Number:
PCT/JP2021/027073
Publication Date:
February 03, 2022
Filing Date:
July 20, 2021
Export Citation:
Assignee:
TORAY INDUSTRIES (JP)
International Classes:
G01T1/20; G01N23/04; G21K4/00
Foreign References:
JP2003240899A | 2003-08-27 | |||
JP2002303697A | 2002-10-18 | |||
JP2018061753A | 2018-04-19 | |||
JPH04212100A | 1992-08-03 | |||
JP2011007552A | 2011-01-13 | |||
US20130193329A1 | 2013-08-01 | |||
JP2019194580A | 2019-11-07 | |||
JP2019023579A | 2019-02-14 | |||
JP2016038324A | 2016-03-22 |
Download PDF:
Previous Patent: FILM FORMING METHOD AND FILM FORMING APPARATUS
Next Patent: INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM
Next Patent: INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM