Title:
SELF REFRESH CYCLE TESTING METHOD AND APPARATUS, AND AUTO REFRESH NUMBER TESTING METHOD AND APPARATUS
Document Type and Number:
WIPO Patent Application WO/2022/068127
Kind Code:
A1
Abstract:
The present disclosure relates to the technical field of integrated circuits, and provides a self refresh cycle testing method and apparatus, and an auto refresh number testing method and apparatus. The self refresh cycle testing method comprises: executing a preset number of data retention capability acquisition steps, the data retention capability acquisition steps comprising determining a preset refresh time; sending a self refresh enter command to control a memory to enter a self refresh operation; after the memory executes the self-refresh of the preset refresh time, sending a self refresh exit command to control the memory to exit the self refresh operation; and detecting the current data retention capability of the memory; acquiring the cycle of the function of the data retention capability related to the corresponding preset refresh time; and, by means of the cycle of the function, determining the self refresh cycle of the memory. In the present disclosure, by means of the natural inconsistency of DRAM capacitance bit metadata retention capabilities, the self refresh cycle and auto refresh number can be accurately measured to facilitate implementation of refresh function verification and analysis of different products.
Inventors:
WANG PENG (CN)
Application Number:
PCT/CN2021/073814
Publication Date:
April 07, 2022
Filing Date:
January 26, 2021
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G11C11/406
Foreign References:
| CN109949844A | 2019-06-28 | |||
| CN1324078A | 2001-11-28 | |||
| US20070002657A1 | 2007-01-04 |
Attorney, Agent or Firm:
BEIJING INTELLEGAL INTELLECTUAL PROPERTY AGENT LTD. (CN)
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