Title:
SEMICONDUCTOR DEVICE AND BATTERY PACK
Document Type and Number:
WIPO Patent Application WO/2020/128743
Kind Code:
A1
Abstract:
Provided is a semiconductor device that detects deterioration of a secondary battery. The present invention has a residual capacity meter, an abnormal current detection circuit, and a control circuit. The residual capacity meter has a shunt circuit and an integration circuit. The abnormal current detection circuit has a first memory, a second memory, and a first comparator. The integration circuit is able to convert a detection current detected at the shunt circuit to a detection voltage by integrating the detection current. The detection voltage, a first signal provided at a first clock time, and a second signal provided at a second clock time are provided to the abnormal current detection circuit. The first signal is able to cause the detection voltage at the first clock time to be stored in the first memory. The second signal is able to cause the detection voltage at the second clock time to be stored in the second memory. The first comparator outputs, to the control circuit, a first output signal that is a change between the detection voltage at the first clock time and the detection voltage at the second clock time.
Inventors:
TAKAHASHI KEI (JP)
IKEDA TAKAYUKI (JP)
TAJIMA RYOTA (JP)
MIKAMI MAYUMI (JP)
MOMMA YOHEI (JP)
KOZUMA MUNEHIRO (JP)
MATSUZAKI TAKANORI (JP)
IKEDA TAKAYUKI (JP)
TAJIMA RYOTA (JP)
MIKAMI MAYUMI (JP)
MOMMA YOHEI (JP)
KOZUMA MUNEHIRO (JP)
MATSUZAKI TAKANORI (JP)
Application Number:
PCT/IB2019/060740
Publication Date:
June 25, 2020
Filing Date:
December 13, 2019
Export Citation:
Assignee:
SEMICONDUCTOR ENERGY LAB (JP)
International Classes:
H01M10/42; G01R31/392; H01M10/48; H02J7/00; H02J7/10
Domestic Patent References:
| WO2016136788A1 | 2016-09-01 |
Foreign References:
| JP2011054413A | 2011-03-17 |
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