Title:
SEMICONDUCTOR DEVICE AND POTENTIAL MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/082894
Kind Code:
A1
Abstract:
[Problem] To provide a semiconductor device that is capable of achieving high resolution by reducing a cell circuit area. [Solution] Provided is a semiconductor device having: a first region where cells each having one of input transistors which constitute a differential amplifier are arranged in an array; and a second region where cells each having the other of the input transistors which constitute the differential amplifier are arranged in an array, wherein the first region and the second region are separated from each other.
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Inventors:
KATO YURI (JP)
Application Number:
PCT/JP2018/039366
Publication Date:
May 02, 2019
Filing Date:
October 23, 2018
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H03F3/45; G01N27/414; G01R29/12; H03F3/68
Domestic Patent References:
| WO2010073520A1 | 2010-07-01 |
Foreign References:
| US5859798A | 1999-01-12 | |||
| JP2015512636A | 2015-04-30 | |||
| JP2002031617A | 2002-01-31 | |||
| JP2002031617A | 2002-01-31 | |||
| JP2014017838A | 2014-01-30 | |||
| JP2005328135A | 2005-11-24 | |||
| JP2009296423A | 2009-12-17 |
Other References:
IEEE JOURNAL OF SOLID STATE CIRCUITS, vol. 45, no. 2, 2010, pages 467 - 482
LAB ON A CHIP, vol. 9, 2009, pages 2647 - 2651
PROCEEDINGS OF THE IEEE, vol. 99, no. 2, February 2011 (2011-02-01), pages 252 - 284
See also references of EP 3703256A4
LAB ON A CHIP, vol. 9, 2009, pages 2647 - 2651
PROCEEDINGS OF THE IEEE, vol. 99, no. 2, February 2011 (2011-02-01), pages 252 - 284
See also references of EP 3703256A4
Attorney, Agent or Firm:
KAMEYA, Yoshiaki (JP)
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