Title:
SEMICONDUCTOR DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/245975
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide a semiconductor device wherein, even with a command signal that is not expected to be transmitted in an inspection step, the breakage of a signal line transmitting the command signal in the inspection step can be diagnosed. This semiconductor device comprises a first semiconductor integrated circuit and a control circuit. The control circuit includes a means that controls a signal line in accordance with a response signal from the first semiconductor integrated circuit. The control circuit also includes a means that controls the signal line independent of signals from the first semiconductor integrated circuit.
Inventors:
TAKAMOTO TOMOKI (JP)
SATOH AKEO (JP)
KOTABE AKIRA (JP)
SATOH AKEO (JP)
KOTABE AKIRA (JP)
Application Number:
PCT/JP2021/003176
Publication Date:
December 09, 2021
Filing Date:
January 29, 2021
Export Citation:
Assignee:
HITACHI ASTEMO LTD (JP)
International Classes:
H04L25/02; G01R31/58; G08C25/00
Foreign References:
| JPH05324153A | 1993-12-07 | |||
| JP2018029285A | 2018-02-22 | |||
| JP2015110295A | 2015-06-18 |
Attorney, Agent or Firm:
TODA Yuji (JP)
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