Title:
SENSOR MONITORING DEVICE, SENSOR MONITORING METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2017/006593
Kind Code:
A1
Abstract:
A sensor monitoring device (100) having a measurement data acquisition unit (110) for acquiring measurement data in which measurement values measured by a sensor terminal under observation are aligned sequentially, a reference data acquisition unit (120) for acquiring reference data that is of the same type as the measurement data and is identical to or has at least a prescribed level of similarity with measurement data measured by the sensor terminal under observation when the same has no abnormalities, and a determination unit (130) for determining whether there is an abnormality in the sensor terminal under observation on the basis of the measurement data and reference data.
Inventors:
SHIMAZU HIDEO (JP)
Application Number:
PCT/JP2016/059586
Publication Date:
January 12, 2017
Filing Date:
March 25, 2016
Export Citation:
Assignee:
NEC SOLUTION INNOVATORS LTD (JP)
International Classes:
G01D21/00
Domestic Patent References:
| WO2012165496A1 | 2012-12-06 |
Foreign References:
| JP2002350198A | 2002-12-04 | |||
| JPH09329470A | 1997-12-22 | |||
| JP2006350707A | 2006-12-28 | |||
| JPH11510898A | 1999-09-21 |
Attorney, Agent or Firm:
HAYAMI Shinji (JP)
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