Title:
SHORT STRIPE REPAIR IN MEMORY SYSTEMS
Document Type and Number:
WIPO Patent Application WO/2024/020929
Kind Code:
A1
Abstract:
Aspects of the present disclosure configure a memory sub-system controller to provide adaptive repair on short stripes. The memory controller groups a plurality of sets of blocks of a set of memory components into respective block stripes. The memory controller computes an average width across the block stripes, the average width representing an average quantity of blocks within each of the block stripes that is associated with a reliability grade that transgresses a threshold and determines that a first block stripe of the block stripes includes a lesser quantity of blocks, associated with reliability grades that transgress the threshold, than the average quantity of blocks. The memory controller, in response to determining that the first block stripe includes the fewer quantity of blocks than the average quantity of blocks, associates one or more blocks of a second block stripe of the block stripes with the first block stripe.
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Inventors:
WEI MENG (CN)
STONELAKE PAUL (US)
NOWELL SHANE (US)
MALSHE ASHUTOSH (US)
STONELAKE PAUL (US)
NOWELL SHANE (US)
MALSHE ASHUTOSH (US)
Application Number:
PCT/CN2022/108565
Publication Date:
February 01, 2024
Filing Date:
July 28, 2022
Export Citation:
Assignee:
MICRON TECHNOLOGY INC (US)
International Classes:
G06F11/07
Foreign References:
| CN113220508A | 2021-08-06 | |||
| CN102508733A | 2012-06-20 | |||
| US20220188009A1 | 2022-06-16 |
Other References:
"Cloud Computing Security Technology", 30 June 2019, ISBN: 978-7-5647-7340-3, article XU,TAO ET AL.: "RAID Principles", pages: 75, XP009553594
Attorney, Agent or Firm:
LEE AND LI - LEAVEN IPR AGENCY LTD. (CN)
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