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Patent Searching and Data


Title:
SOLID-STATE IMAGING ELEMENT AND IMAGING DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/193800
Kind Code:
A1
Abstract:
Provided is a solid-state imaging element in which charge is accumulated on a charge accumulation unit, wherein the conversion efficiency for converting charge to voltage is improved. A high-sensitivity-side transfer transistor transfers charge to a first charge accumulation unit from a high-sensitivity photodiode having a sensitivity higher than a predetermined sensitivity. A low-sensitivity-side transfer transistor transfers charge to a second charge accumulation unit from a low-sensitivity photodiode having a sensitivity lower than a predetermined sensitivity. An amplifying transistor amplifies a voltage of the first charge accumulation unit. A first conversion efficiency control transistor controls conversion efficiency for converting charge to voltage by opening/closing a path between the first and second charge accumulation units. A second conversion efficiency control transistor controls conversion efficiency by opening/closing a path between the second charge accumulation unit and a third charge accumulation unit.

Inventors:
YONEMOTO KAZUYA (JP)
Application Number:
PCT/JP2019/000551
Publication Date:
October 10, 2019
Filing Date:
January 10, 2019
Export Citation:
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Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H04N5/355; H01L27/146; H04N5/3745; H04N5/378
Domestic Patent References:
WO2017169216A12017-10-05
WO2017141727A12017-08-24
WO2017043343A12017-03-16
Foreign References:
JP2017004985A2017-01-05
Attorney, Agent or Firm:
MARUSHIMA, Toshikazu (JP)
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