Title:
SOLID-STATE IMAGING ELEMENT, TEST SYSTEM, AND CONTROL METHOD FOR SOLID-STATE IMAGING ELEMENT
Document Type and Number:
WIPO Patent Application WO/2019/187684
Kind Code:
A1
Abstract:
A solid-state imaging element that detects address events and facilitates determination of abnormalities. A solid-state imaging element that comprises a photoelectric conversion element, a test signal supply part, a selection part, and a comparator. The photoelectric conversion element converts incident light into an electrical signal by means of photoelectric conversion. The test signal supply part supplies, as a test signal, a signal that changes as time passes. The selection part selects the electrical signal or the test signal. The comparator compares the signal selected by the selection part with a prescribed threshold value and outputs the comparison results.
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Inventors:
NIWA ATSUMI (JP)
Application Number:
PCT/JP2019/004389
Publication Date:
October 03, 2019
Filing Date:
February 07, 2019
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H04N5/378; H01L27/146; H04N5/367; H04N5/374
Domestic Patent References:
| WO2017086181A1 | 2017-05-26 |
Foreign References:
| JP2001008237A | 2001-01-12 | |||
| JP2014017834A | 2014-01-30 | |||
| JP2017521746A | 2017-08-03 | |||
| JP2005093487A | 2005-04-07 | |||
| JP2016533140A | 2014-11-14 |
Other References:
LICHTSTEINER, PATRICK ET AL.: "A 128X128 120dB 15ยต s Latency Asynchronous Temporal Contrast Vision Sensor", IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 43, no. 2, 31 January 2008 (2008-01-31), pages 566 - 576, XP011200748, doi:10.1109/JSSC.2007.914337
See also references of EP 3780583A4
See also references of EP 3780583A4
Attorney, Agent or Firm:
MARUSHIMA, Toshikazu (JP)
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