Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
SPECTRUM ANALYZER SYSTEM AND SPECTRUM ANALYZE METHOD
Document Type and Number:
WIPO Patent Application WO/2008/023640
Kind Code:
A1
Abstract:
Provided is a spectrum analyzer system for measuring a signal component of each frequency of an input signal. The spectrum analyzer includes: a sampling unit for sampling the input signal for each predetermined bandwidth so as to be digitized and outputting the digital output signal; a conversion unit for converting the digital output signal outputted from the sampling unit into a signal component of each frequency of the unit bandwidth; and an output unit which outputs the digital output signal outputted from the sampling unit if the frequency span as the frequency range for outputting the measurement result of the signal component of each frequency of the input signal is not smaller than a predetermined reference bandwidth and outputs the signal component of each frequency converted by the conversion unit if the frequency span is smaller than the reference bandwidth.

Inventors:
KANOH EIJI (JP)
NAKANISHI MAKOTO (JP)
ORIKASA TATSURU (JP)
YAMANOUCHI TOMOO (JP)
Application Number:
PCT/JP2007/066020
Publication Date:
February 28, 2008
Filing Date:
August 17, 2007
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
ADVANTEST CORP (JP)
KANOH EIJI (JP)
NAKANISHI MAKOTO (JP)
ORIKASA TATSURU (JP)
YAMANOUCHI TOMOO (JP)
International Classes:
G01R23/173
Foreign References:
JPH01105181A1989-04-21
JPH0247563A1990-02-16
JPS63317781A1988-12-26
JPH0514937U1993-02-26
JP2001249149A2001-09-14
Attorney, Agent or Firm:
RYUKA, Akihiro (22-1 Nishi-Shinjuku 6-chom, Shinjuku-ku Tokyo 05, JP)
Download PDF: