Title:
SPECTRUM MEASUREMENT METHOD USING FOURIER-TRANSFORM-TYPE SPECTROMETER
Document Type and Number:
WIPO Patent Application WO/2017/135356
Kind Code:
A1
Abstract:
A spectrum measurement method comprising applying a Fourier transform to an interferogram of infrared interference waves acquired using an interferometer, the spectrum measurement method including a step for oversampling intensity signals of infrared interference waves at each position (D1, D1, . . .) of a movable mirror using the wavelength λ1 of a semiconductor laser as a reference, and a step for inserting intensity signals (I1', I2', . . .) that would be obtained in the case of sampling infrared interference waves at each position (D1', D2', . . .) of the movable mirror using the wavelength λ0 of an He-Ne laser as a reference using the intensity signals (I1, I2, . . .) acquired by the oversampling, and the spectrum measurement method being capable of effectively utilizing existing spectral data and the like measured using the wavelength λ0 by calculating a spectrum from an interferogram based on the inserted intensity signals.
Inventors:
SUNAMI TESTUJI (JP)
SHIMAMURA TAKASHI (JP)
WAKIMOTO NORIO (JP)
KOSHOBU JUN (JP)
SHIMAMURA TAKASHI (JP)
WAKIMOTO NORIO (JP)
KOSHOBU JUN (JP)
Application Number:
PCT/JP2017/003726
Publication Date:
August 10, 2017
Filing Date:
February 02, 2017
Export Citation:
Assignee:
JASCO CORP (JP)
International Classes:
G01J3/45
Domestic Patent References:
| WO2014199888A1 | 2014-12-18 | |||
| WO2012056813A1 | 2012-05-03 |
Foreign References:
| JPH063189A | 1994-01-11 | |||
| JP2009103686A | 2009-05-14 | |||
| JP2013250127A | 2013-12-12 | |||
| JP2003227754A | 2003-08-15 | |||
| JPH063192A | 1994-01-11 | |||
| US20060262316A1 | 2006-11-23 | |||
| US20050073690A1 | 2005-04-07 | |||
| JPH0227226A | 1990-01-30 | |||
| JPH1090065A | 1998-04-10 | |||
| JP2006125971A | 2006-05-18 |
Other References:
See also references of EP 3413021A4
Attorney, Agent or Firm:
IWAHASHI, Yuji (JP)
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