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Title:
STRAIN MEASURING DEVICE AND STRAIN MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2020/246460
Kind Code:
A1
Abstract:
A strain measuring device (10) comprises: a light source (20), an imaging device (30), and a processing device (40). The light source (20) emits excitation light for exciting a mechanoluminescent body to a predetermined state. The imaging device (30) images light emitted by the mechanoluminescent body. The processing device (40) calculates a strain of the mechanoluminescent body when a force is applied to the mechanoluminescent body, on the basis of a light emission pattern of the mechanoluminescent body when the force is applied to the mechanoluminescent body, and an amount of remaining light of the mechanoluminescent body after being excited to the predetermined state.

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Inventors:
XU CHAO-NAN (JP)
TSUDA TOMOYA (JP)
SASAYAMA TOMOKI (JP)
Application Number:
PCT/JP2020/021756
Publication Date:
December 10, 2020
Filing Date:
June 02, 2020
Export Citation:
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Assignee:
AIST (JP)
SHIMADZU CORP (JP)
International Classes:
G01B11/16; G01L1/00; G01L1/24; G01N21/63; G01N21/70
Foreign References:
JP2018119834A2018-08-02
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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