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Title:
STROOP TEST METHOD, STROOP TEST PROGRAM, STROOP TEST SYSTEM, STROOP TEST IMAGE GENERATION METHOD, STROOP TEST IMAGE GENERATION PROGRAM, AND TEST METHOD
Document Type and Number:
WIPO Patent Application WO/2024/019006
Kind Code:
A1
Abstract:
In this Stroop test method, an evaluation of a subject is indicated on the basis of line-of-sight position information indicating the position of the line-of-sight of the subject in a test image (S102-S105). The test image has a question region in which a question for the subject is displayed, and an answer region in which a plurality of options for the subject to select to answer the question by means of the line-of-sight are displayed, the plurality of options including a correct option and one or more incorrect options. The one or more incorrection options include a decoy option that a subject may be guided to by the Stroop effect.

Inventors:
TAKEDA SHUKO (JP)
MORISHITA RYUICHI (JP)
Application Number:
PCT/JP2023/026038
Publication Date:
January 25, 2024
Filing Date:
July 14, 2023
Export Citation:
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Assignee:
UNIV OSAKA (JP)
International Classes:
A61B10/00; A61B3/113; G06F3/01; G06F3/0346
Domestic Patent References:
WO2013111746A12013-08-01
Foreign References:
JP2018175052A2018-11-15
JP2019171022A2019-10-10
JP2018512202A2018-05-17
JP2020531096A2020-11-05
JP2014068932A2014-04-21
Other References:
FARHA NADIA ABU; AL-SHARGIE FARES; TARIQ USMAN; AL-NASHASH HASAN: "Artifact Removal of Eye Tracking Data for the Assessment of Cognitive Vigilance Levels", 2021 SIXTH INTERNATIONAL CONFERENCE ON ADVANCES IN BIOMEDICAL ENGINEERING (ICABME), IEEE, 7 October 2021 (2021-10-07), pages 175 - 179, XP034018667, DOI: 10.1109/ICABME53305.2021.9604870
OTSUKA, ASAKO, GUNJI, ATSUKO: "Influences of short-term psychological stress on peripheral vision: an eye-tracking study.", BULLETIN 1, EDUCATIONAL SCIENCE, COLLEGE OF EDUCATION, YOKOHAMA NATIONAL UNIVERSITY, no. 3, 28 February 2020 (2020-02-28), College of Education, Yokohama National University, pages 14 - 23, XP009552112
Attorney, Agent or Firm:
NII, Hiromori (JP)
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