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Title:
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION DEVICE, AND STRUCTURE EVALUATION METHOD
Document Type and Number:
WIPO Patent Application WO/2018/051535
Kind Code:
A1
Abstract:
A structure evaluation system according to this embodiment has a plurality of sensors, a signal processing unit, and an evaluation unit. The sensors detect elastic waves emitted by the structure. On the basis of the elastic waves detected by the plurality of sensors, the signal processing unit acquires the reliability of the elastic waves. On the basis of the acquired reliability, the evaluation unit evaluates the soundness of the structure.

Inventors:
IIDA SANAE (JP)
USUI TAKASHI (JP)
Application Number:
PCT/JP2017/007982
Publication Date:
March 22, 2018
Filing Date:
February 28, 2017
Export Citation:
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Assignee:
TOSHIBA KK (JP)
International Classes:
G01N29/14; G01N29/44
Foreign References:
JP2006010595A2006-01-12
JP2007198907A2007-08-09
JP2014174040A2014-09-22
US4531411A1985-07-30
JP2014095555A2014-05-22
Other References:
See also references of EP 3321674A4
Attorney, Agent or Firm:
SHIGA INTERNATIONAL PATENT OFFICE (JP)
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