Title:
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION DEVICE, AND STRUCTURE EVALUATION METHOD
Document Type and Number:
WIPO Patent Application WO/2018/051534
Kind Code:
A1
Abstract:
A structure evaluation system according to this embodiment has a plurality of sensors, a signal processing unit, and an evaluation unit. The sensors detect elastic waves emitted by the structure. By performing signal processing on the elastic waves detected by the plurality of sensors, the signal processing unit acquires the reliability of the obtained elastic waves from the emission source to the plurality of sensors. On the basis of the acquired reliability, the evaluation unit evaluates the soundness of the structure.
More Like This:
| JPH0961407 | ACOUSTIC EMISSION MEASURING APPARATUS |
| WO/2013/081850 | FOULING REDUCTION DEVICE AND METHOD |
Inventors:
IIDA SANAE (JP)
USUI TAKASHI (JP)
USUI TAKASHI (JP)
Application Number:
PCT/JP2017/007974
Publication Date:
March 22, 2018
Filing Date:
February 28, 2017
Export Citation:
Assignee:
TOSHIBA KK (JP)
International Classes:
G01N29/14; G01N29/44
Foreign References:
| JP2006010595A | 2006-01-12 | |||
| JP2007198907A | 2007-08-09 | |||
| JP2014174040A | 2014-09-22 | |||
| US4531411A | 1985-07-30 | |||
| JP2014095555A | 2014-05-22 |
Other References:
See also references of EP 3321673A4
Attorney, Agent or Firm:
SHIGA INTERNATIONAL PATENT OFFICE (JP)
Download PDF:
Previous Patent: WORK MACHINE
Next Patent: STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION DEVICE, AND STRUCTURE EVALUATION METHOD
Next Patent: STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION DEVICE, AND STRUCTURE EVALUATION METHOD