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Title:
STRUCTURE, SOLID-STATE IMAGING ELEMENT, INFRARED SENSOR AND COMPOSITION
Document Type and Number:
WIPO Patent Application WO/2018/092600
Kind Code:
A1
Abstract:
Provided are: a structure used for an infrared sensor, etc. that is capable of performing highly sensitive sensing using a near-infrared ray; a solid-state imaging element; and an infrared sensor. Also provided is a composition that is used for producing the structure. This structure 10 has: a near-infrared transmission filter 12 that shields light in the visible region and transmits at least a part of the light in the near-infrared region; and a member 13 which is disposed on the light path of the near-infrared transmission filter 12 and at the incident light side of the near-infrared transmission filter 12 and/or at the outgoing light side of the near-infrared transmission filter 12, which transmits the light in the near-infrared region, and which has a refractive index of at least 1.7 with respect to the light in the near-infrared region.

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Inventors:
TAKISHITA HIROTAKA (JP)
FUKAMI YUTARO (JP)
ARAYAMA KYOHEI (JP)
IDEI HIROAKI (JP)
OGAWA MICHIHIRO (JP)
KANEKO YUSHI (JP)
KITAJIMA SHUNSUKE (JP)
Application Number:
PCT/JP2017/039719
Publication Date:
May 24, 2018
Filing Date:
November 02, 2017
Export Citation:
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Assignee:
FUJIFILM CORP (JP)
International Classes:
G02B5/22; G02B3/00; G02B5/20; H01L31/0232
Domestic Patent References:
WO2015182278A12015-12-03
WO2017110939A12017-06-29
Foreign References:
JP2004198617A2004-07-15
JP2008502938A2008-01-31
JP2003171680A2003-06-20
Attorney, Agent or Firm:
NAKASHIMA Junko et al. (JP)
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