Title:
SURFACE DEFECT DETECTION METHOD AND APPARATUS, AND ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/233166
Kind Code:
A1
Abstract:
The embodiments of the present application provide a surface defect detection method and apparatus, and an electronic device. The surface defect detection method comprises: acquiring an image to be tested; inputting the image to be tested into a pre-trained deep learning network model, so as to obtain a defect-free reconstructed image corresponding to the image to be tested, the deep learning network model being a deep learning network model obtained by performing pre-training on the basis of a sample training set comprising a plurality of defect-free training sample images; calculating the difference between the reconstructed image and the image to be tested, so as to obtain a difference image; and in the difference image, if there is an area of which the difference value is greater than a preset difference value, determining that the image to be tested has a surface defect. The present solution can improve the surface defect detection rate.
Inventors:
WANG XUE (CN)
Application Number:
PCT/CN2019/079746
Publication Date:
December 12, 2019
Filing Date:
March 26, 2019
Export Citation:
Assignee:
HANGZHOU HIKVISION DIGITAL TEC (CN)
International Classes:
G06K9/62
Foreign References:
| CN106650770A | 2017-05-10 |
Attorney, Agent or Firm:
PATENTSINO IP FIRM (CN)
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