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Patent Searching and Data


Title:
SURFACE FORCE MEASUREMENT METHOD AND SURFACE FORCE MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/115634
Kind Code:
A1
Abstract:
The present invention provides a method and a device for measuring force (hereinafter referred to as surface force) acting between two substance surfaces. A surface force measurement method comprises: moving an object to be measured (1) to a probe (4) until the probe (4) is adsorbed to the object to be measured (1); thereafter applying a load to a support member (6) by an electromagnetic force generator (20) in a direction in which the probe (4) separates from the object to be measured (1) while gradually increasing an electric current to be supplied to the electromagnetic force generator (20); acquiring the value of the electric current being supplied to the electromagnetic force generator (20) when the probe (4) has separated from the object to be measured (1); and converting the electric current value into surface force acting between the probe (4) and the object to be measured (1).

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Inventors:
AMEMIYA HIRONAO (JP)
KOBAYASHI HAYATO (JP)
KATO TAKAHISA (JP)
Application Number:
PCT/JP2014/050666
Publication Date:
July 31, 2014
Filing Date:
January 16, 2014
Export Citation:
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Assignee:
ELIONIX INC (JP)
International Classes:
G01N19/04; G01N3/08
Foreign References:
JP2003161684A2003-06-06
JPH0972925A1997-03-18
JP2006284598A2006-10-19
JPH0611435A1994-01-21
JP2011038851A2011-02-24
JP2001108603A2001-04-20
JP2003161684A2003-06-06
Other References:
See also references of EP 2950080A4
Attorney, Agent or Firm:
WATANABE, Isamu et al. (JP)
Isamu Watanabe (JP)
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