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Title:
SYNTHESIS-PARAMETER GENERATION DEVICE FOR THREE-DIMENSIONAL MEASUREMENT APPARATUS
Document Type and Number:
WIPO Patent Application WO/2013/187204
Kind Code:
A1
Abstract:
A plurality of units comprising a projector for projecting a periodic lattice onto an object to be measured, and a camera for imaging the projected lattice are provided around the periphery of the object to be measured, and coordinate conversion is used to synthesize three-dimensional coordinates measured by each unit. A first lattice displayed on a reference surface is imaged, and a phase for the first lattice is obtained for each camera pixel and stored. A second lattice is projected from a projector onto the reference surface and imaged, and three-dimensional coordinates of the reference surface are obtained for each camera pixel and stored. Phases for each camera pixel are interpolated, subpixels having a common phase among cameras are generated, three-dimensional coordinates of each subpixel are obtained, and synthesis parameters are generated such that three-dimensional coordinates of subpixels having the same phase are in accordance among units. As a result, accuracy of synthesis parameters for coordinate conversion is improved.

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Inventors:
IWAI KAZUTAKA (JP)
SHIMO KOSUKE (JP)
Application Number:
PCT/JP2013/064278
Publication Date:
December 19, 2013
Filing Date:
May 22, 2013
Export Citation:
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Assignee:
SHIMA SEIKI MFG (JP)
International Classes:
G01B11/25
Foreign References:
JP2004108950A2004-04-08
JP2010145186A2010-07-01
JP2005189203A2005-07-14
JP2002341031A2002-11-27
JP4291358B22009-07-08
JP2903111B11999-06-07
JP4429135B22010-03-10
JPH0358442B21991-09-05
Other References:
See also references of EP 2863166A4
Attorney, Agent or Firm:
SHIOIRI Akira et al. (JP)
Akira Shioiri (JP)
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