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Patent Searching and Data


Title:
SYSTEM, APPARATUS, METHOD, AND PROGRAM FOR MEASUREMENT OF LEAF AREA INDEX
Document Type and Number:
WIPO Patent Application WO/2012/073519
Kind Code:
A1
Abstract:
Provided is a leaf area index measurement system provided with: a reflector arranged in the vicinity of a plant to be subjected to measurement; an image capturing means that is arranged at a position where no shielding object exists between the image capturing means and the reflector, and that is for capturing an image of the reflector and outputting the captured image; an intensity calculating means for calculating the intensity of light reflected by the reflector, on the basis of the captured image outputted by the image capturing means; and a leaf area index calculating means for calculating a leaf area index on the basis of the intensity of light calculated by the intensity calculating means.

Inventors:
TSUKADA MASATO (JP)
Application Number:
PCT/JP2011/006763
Publication Date:
June 07, 2012
Filing Date:
December 02, 2011
Export Citation:
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Assignee:
NEC CORP (JP)
TSUKADA MASATO (JP)
International Classes:
G01N21/27; A01G7/00; G01B11/28
Foreign References:
JP2007171033A2007-07-05
JP2006101768A2006-04-20
JP2006284596A2006-10-19
JP2002040022A2002-02-06
JP2005098937A2005-04-14
Other References:
MASATOSHI AOKI ET AL.: "Remote sensing of chlorophyll content of leaf. II. Effective spectral reflection characteristics for evaluations of chlorophyll content and leaf area index of plant community", ENVIRONMENT CONTROL IN BIOLOGY, vol. 24, no. 1, 1986, pages 33 - 39
Attorney, Agent or Firm:
IWAKABE, Fuyuki et al. (JP)
Rock face Fuyuki (JP)
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Claims: