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Title:
SYSTEM, APPARATUS, METHOD, AND PROGRAM FOR MEASUREMENT OF LEAF AREA INDEX
Document Type and Number:
WIPO Patent Application WO/2012/073520
Kind Code:
A1
Abstract:
A leaf area index measurement system is characterized in being provided with: an image capturing means for capturing an image of a plant to be subjected to measurement, and outputting the captured image; a light source arranged at a side opposite the image capturing means with respect to the plant to be subjected to measurement, or arranged at the position of the plant to be subjected to measurement; an intensity calculating means for calculating the intensity of light when the light source emits light, on the basis of the captured image outputted by the image capturing means; and a leaf area index calculating means for calculating a leaf area index on the basis of the intensity of light calculated by the intensity calculating means.

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Inventors:
SERIZAWA MASAHIRO (JP)
Application Number:
PCT/JP2011/006764
Publication Date:
June 07, 2012
Filing Date:
December 02, 2011
Export Citation:
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Assignee:
NEC CORP (JP)
SERIZAWA MASAHIRO (JP)
International Classes:
G01N21/27; A01G7/00; G01B11/28
Domestic Patent References:
WO2007069736A12007-06-21
Foreign References:
JP2005052045A2005-03-03
JP2008111725A2008-05-15
JP2003143961A2003-05-20
Attorney, Agent or Firm:
IWAKABE, Fuyuki et al. (JP)
Rock face Fuyuki (JP)
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