Title:
TEMPERATURE MEASUREMENT PROCESSING METHOD AND APPARATUS, AND THERMAL IMAGING DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/020021
Kind Code:
A1
Abstract:
Provided are a temperature measurement processing method and apparatus and a thermal imaging device. The temperature measurement processing method is applied to an image device, and comprises: mapping, according to a specified mapping relationship, a feature of interest, associated with a target object, in a visible light image to a thermal imaging image so as to determine a mapping position, on the thermal imaging image, of the feature of interest, wherein the visible light image and the thermal imaging image are respectively acquired by means of a visible light channel and a thermal imaging channel of the image device in a scenario where the target object is placed at a specified distance away from the front of the image device; adjusting the mapping position, in the thermal imaging image, of the feature of interest according to an offset, so that at least some of the image segments, in the thermal imaging image, representing the target object are selected from the feature of interest; and measuring the temperature of the target object according to the image segments, selected from the feature of interest, in the thermal imaging image.
Inventors:
LING ZHENPING (CN)
Application Number:
PCT/CN2019/096261
Publication Date:
January 30, 2020
Filing Date:
July 17, 2019
Export Citation:
Assignee:
HANGZHOU HIKVISION DIGITAL TEC (CN)
International Classes:
G01J5/12
Foreign References:
| CN107976257A | 2018-05-01 | |||
| CN102982518A | 2013-03-20 | |||
| CN104359560A | 2015-02-18 | |||
| CN107179494A | 2017-09-19 | |||
| JP2015194367A | 2015-11-05 |
Other References:
See also references of EP 3800451A4
Attorney, Agent or Firm:
BEIJING BESTIPR INTELLECTUAL PROPERTY LAW CORPORATION (CN)
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