Title:
TERAHERTZ DETECTION SENSOR AND TERAHERTZ IMAGE MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/104697
Kind Code:
A1
Abstract:
A terahertz image measurement device (20) is provided with a terahertz detection sensor (13), a magnetic field generating unit (19), and a measurement control unit (20). The sensor (13) detects near-field terahertz light emitted from a sample (18). The magnetic field generating unit (19) has a coil (19a) on the periphery of the sample (18) and the sensor (13), the coil (19a) being wound so as to surround the optical axis of terahertz light radiated to the sensor (13) from the sample (18), and applies to the sensor (13) a magnetic field generated by flow of an electric current to the coil (19a). The measurement control unit (20) distributes an electric current to the coil (19a), changes the electric current value and sets the strength of the magnetic field to a magnetic field value whereby the detection signal level of the terahertz light of the sample detected by the sensor (13) increases prominently, and causes the magnetic field strength to conform to a specific frequency of the terahertz light.
Inventors:
KAWANO YUKIO (JP)
Application Number:
PCT/JP2016/087196
Publication Date:
June 22, 2017
Filing Date:
December 14, 2016
Export Citation:
Assignee:
TOKYO INST TECH (JP)
International Classes:
G01Q60/22; G01J1/02; G01N21/3581
Domestic Patent References:
| WO2012108306A1 | 2012-08-16 |
Foreign References:
| JP2010019585A | 2010-01-28 | |||
| JP2010060284A | 2010-03-18 | |||
| JP2015155847A | 2015-08-27 | |||
| JP2010060284A | 2010-03-18 | |||
| JP2010206176A | 2010-09-16 |
Other References:
See also references of EP 3392662A4
Attorney, Agent or Firm:
ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)
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