Title:
TEST APPARATUS, METHOD FOR CORRECTING AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2011/001463
Kind Code:
A1
Abstract:
Provided is a test apparatus for testing a device to be tested, which is equipped with first and second terminal groups that have a plurality of drivers to output a signal to the device to be tested, a first common setting unit that commonly sets a delay amount of a signal outputted from the drivers in the first and second terminal groups, an inter-group adjustment unit makes a reference phase of a signal outputted from the plurality of the drivers in the first terminal group close to a reference phase of a signal outputted from the plurality of the drivers in the second terminal group in accordance with a set value of the delay amount set by the first common setting unit in the case where the reference phase is adjusted in the first terminal group and a set value of the delay amount set by the first common setting unit in the case where the reference phase is adjusted in the second terminal group.
Inventors:
KOZUKA NORIYOSHI (JP)
Application Number:
PCT/JP2009/002996
Publication Date:
January 06, 2011
Filing Date:
June 29, 2009
Export Citation:
Assignee:
ADVANTEST CORP (JP)
KOZUKA NORIYOSHI (JP)
KOZUKA NORIYOSHI (JP)
International Classes:
G01R31/28
Domestic Patent References:
| WO2007072738A1 | 2007-06-28 | |||
| WO2009069209A1 | 2009-06-04 |
Foreign References:
| JP2008122251A | 2008-05-29 | |||
| JP2007024524A | 2007-02-01 |
Attorney, Agent or Firm:
RYUKA IP LAW FIRM (JP)
Ryuka international patent business corporation (JP)
Ryuka international patent business corporation (JP)
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