Title:
TEST APPARATUS AND TEST METHOD
Document Type and Number:
WIPO Patent Application WO/2005/026756
Kind Code:
A1
Abstract:
A test apparatus for testing electronic devices, comprising a plurality of signal supplying parts for outputting, based on input signals inputted thereto, output signals for testing electronic devices; a loop circuit for looping and inputting the output signals, as input signals, to the respective signal supplying parts that outputted those output signals; a counter part for measuring the periods from a time at which the input signals are inputted to the respective signal supplying parts to a time at which the looped signals are inputted thereto; and a control part for controlling the timings at which the signal supplying parts output the output signals such that the periods of the signal supplying parts measured by the counter part are approximately the same.
Inventors:
KANBAYASHI HIRONORI (JP)
Application Number:
PCT/JP2004/013233
Publication Date:
March 24, 2005
Filing Date:
September 10, 2004
Export Citation:
Assignee:
ADVANTEST CORP (JP)
KANBAYASHI HIRONORI (JP)
KANBAYASHI HIRONORI (JP)
International Classes:
G01R31/317; G01R31/3183; G01R31/28; G01R31/319; (IPC1-7): G01R31/28
Foreign References:
| JPH10197611A | 1998-07-31 | |||
| JP2002139556A | 2002-05-17 | |||
| JPH0651027A | 1994-02-25 | |||
| JPS61176871A | 1986-08-08 |
Other References:
See also references of EP 1666901A4
Attorney, Agent or Firm:
Ryuka, Akihiro (24-12 Shinjuku 1-chome, Shinjuku-k, Tokyo 22, JP)
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