SEMICONDUCTOR TEST SYSTEM - ADVANTEST CORP

Title:

SEMICONDUCTOR TEST SYSTEM

Document Type and Number:

WIPO Patent Application WO/2005/026754

Kind Code:

A1

Abstract:

A semiconductor test system, comprising a semiconductor test apparatus supplying test signals to a tested device to test the tested device, a performance board electrically connecting the semiconductor test apparatus to the tested device, and a carrying apparatus carrying the tested device and electrically connecting the tested device to the performance board. The carrying apparatus further comprises a casing enclosing the performance board and a carrying arm carrying the tested device and pressing the tested device against the performance board to press the performance board against the inner surface of the casing through the tested device pressing, against the casing so as to press, against the casing, the rear surface of the surface of the performance board on which the test device is pressed.

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Inventors:

ITO YOSHIMASA (JP)
NAMIKI KATSUHIKO (JP)

Application Number:

PCT/JP2004/013076

Publication Date:

March 24, 2005

Filing Date:

September 08, 2004

Export Citation:

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Assignee:

ADVANTEST CORP (JP)
ITO YOSHIMASA (JP)
NAMIKI KATSUHIKO (JP)

International Classes:

G01R31/28; (IPC1-7): G01R31/28

Foreign References:

JPH10160788A	1998-06-19
JPS60190875A	1985-09-28

Other References: